TEM Specimen Preparation for In Situ Heating Experiments Using FIB
نویسندگان
چکیده
منابع مشابه
TEM specimen preparation techniques
Transmission electron microscopy (TEM) is a powerful tool for the investigation of the microstructure of materials, providing crystallographic information and composition at the nanometer scale. For such studies, samples should be transparent to the electron beam. In this review, TEM sample preparation techniques for different classes of materials, such as metals and alloys, multilayered coatin...
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The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated c...
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Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino, and Joseph Michael preparation can be applied to almost any material type—hard, soft, or combinations thereof. The number of materials for which successful TEM sample preparation with FIBs has been documented certainly reaches several hundred and spans from hard matter such as metals, ceramics, and composites to soft matter including polymers, ...
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The recent development of Dual-BeamTM or Cross-BeamTM FIB systems has gradually taken over the traditional single beam FIB systems. A typical FIB column contains a liquid metal ion source that produces a finely focused Ga ion beam. The primary Ga ion beam is accelerated by 30-50 kV, and directed towards the features of interest on the specimen. The incident ion beam will sputter atoms from the ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2017
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192761700215x